Fecha de publicación: 30/01/1992 Semiconductor devices – Integrated circuits – Part 2: Digital integrated circuits – Section four: Family specification for complementary MOS digital integrated circuits, series 4000 B and 4000 UB IEC 60748-2-4:1992
Fecha de publicación: 31/01/1992 Semiconductor devices – Integrated circuits – Part 2: Digital integrated circuits – Section five: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB) IEC 60748-2-5:1992
Fecha de publicación: 20/02/1992 Semiconductor devices – Integrated circuits – Part 2: Digital integrated circuits – Section three: Blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU) IEC 60748-2-3:1992
Fecha de publicación: 29/02/1992 Semiconductor devices. Integrated circuits – Part 2: Digital integrated circuits – Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU IEC 60748-2-2:1992
Fecha de publicación: 29/02/1992 Amendment 1 – Fixed capacitors for use in electronic equipment. Part 15: Blank detail specification: Fixed tantalum capacitors with solid electrolyte and porous anode. Assessment level E IEC 60384-15-3:1984/AMD1:1992
Fecha de publicación: 01/03/1992 Corrigendum 1 – Transformers for tubular discharge lamps having a no-load output voltage exceeding 1000 V (generally called neon-transformers). General and safety requirements IEC 61050:1991/COR1:1992
Fecha de publicación: 15/03/1992 High pressure xenon short arc lamps – Dimensional, electrical and photometric data and cap types IEC TR 61127:1992
Fecha de publicación: 15/03/1992 Procedure for use in the preparation of maximum lamp outlines IEC 61126:1992
Fecha de publicación: 15/03/1992 Calculation of the lower and upper limits for the average outer dimensions of cables with circular copper conductors and of rated voltages up to and including 450/750 V IEC 60719:1992
Fecha de publicación: 01/04/1992 Semiconductor devices – Integrated circuits – Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits IEC 60748-11-1:1992